Blair MA, et al. - Researchers investigated the relative contributions of daily-life executive function (EF) and attachment difficulties (avoidance and anxiety) to psychotic like experiences (PLE's) in typically developing youth. EF deficits and high attachment insecurity both were observed accounting for a significant proportion of the variance in PLE's and interacted to predict PLE manifestation. Specifically, for positive PLEs, predictive factors were greater trouble monitoring behavioral impact, less difficulty completing tasks, greater difficulty regulating emotional reactions, greater difficulty controlling impulses and higher attachment anxiety. For negative PLEs, predictive factors were greater difficulty in alternating attention, transitioning across situations, and regulating emotional reactions as well as higher attachment anxiety.